SH-wave diffraction on a thin interface finite defect in the joint of an elastic layer and a half-space

Keywords

diffraction, defect, impedance, elastic layer, Wiener–Hopf technique.

Cite as

Kuryliak D. B., Nazarchuk Z. T., Voytko M. V., and Kulynych Ya. P. SH-wave diffraction on a thin interface finite defect in the joint of an elastic layer and a half-space. Physicochemical Mechanics of Materials. 2022. 58(6), 012-018.

Abstract

The elastic SH-wave diffraction from the finite defect that is formed on the boundary of the rigid joint between a layer and a half-space is considered. The model of the defect is an im­pedance strip on the surface of the joint. Using the Wiener–Hopf technique, the problem is reduced to an infinite system of linear algebraic equations. Its solution is used to clarify the features of the displaced field on the surface of an elastic layer which is free from the stress.

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